About the Capability of X-ray Diffraction Technique for Diagnostics of Technological Residual Stresses
About the Capability of X-ray Diffraction Technique for Diagnostics of Technological Residual Stresses
File Size:
831.10 kB
Author:
Kamil Kolařík, Nikolaj Ganev, Zdenek Pala
Date:
22 December 2017
Autor:
Kamil Kolařík, Nikolaj Ganev, Zdenek Pala