Residual Stress Analysis using ION-C Device
Residual Stress Analysis using ION-C Device
File Size:
2.90 MB
Author:
Jaroslav Václavík, Petr Bohdan, Stanislav Holý, Otakar Weinberg
Date:
22 December 2017
Autor:
Jaroslav Václavík, Petr Bohdan, Stanislav Holý, Otakar Weinberg